Exploring Electrostatic Confinement Transport in MoS2/WSe2 Heterostructure via Triple‐Gated Point Contact Device

Author:

Phan Nhat Anh Nguyen1ORCID,Uddin Inayat1ORCID,Le Thi Hai Yen2,Aoki Nobuyuki3ORCID,Kim Hye Jung4ORCID,Watanabe Kenji5,Taniguchi Takashi6,Kim Gil‐Ho12

Affiliation:

1. Department of Electrical and Computer Engineering Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea

2. Samsung‐SKKU Graphene Centre Sungkyunkwan Advanced Institute of Nanotechnology (SAINT) Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea

3. Department of Materials Science Chiba University Chiba 263–8522 Japan

4. Department of Physics Pusan National University Busan 46241 Republic of Korea

5. Research Center for Functional Materials National Institute for Materials Science 1‐1 Namiki Tsukuba 305‐0044 Japan

6. International Center for Material Nano‐Architectonics National Institute for Materials Science 1‐1 Namiki Tsukuba 305‐0044 Japan

Abstract

AbstractThe exponential development in quantum phenomena is directly correlated with the decreasing size of nano‐semiconductor transistors. Consequently, the use of a quantum structure that deviates from traditional transistor types becomes imperative. Electrostatically defined nanoscale devices within 2D semiconductor heterostructures serve as foundational elements for diverse quantum electrical circuits. Van der Waals heterostructures, distinguished by atomically flat interfaces and inherent 2D characteristics, offer advantages such as large‐scale uniformity, flexibility, and portability over conventional bulk semiconductor heterostructures. Herein, the intricate electronic behavior of a MoS2/WSe2 encapsulated heterostructure governed by split‐gate and middle‐gate configurations is investigated, revealing a distinctive step‐like current profile at a low temperature of 77 K. The observed four regimes in the current highlight the impact of quantum confinement induced by reduced lateral dimensions, coupled with precise electrostatic confinement controlled by gate voltages. The temperature dependence of the phenomena emphasizes the role of thermal effects on carrier scattering mechanisms. In addition, the pinch‐off characteristics with different temperatures, middle‐gate voltages, and drain biases are explored. This study contributes to a deeper understanding of electrostatic effects in 2D transition metal dichalcogenide heterostructures and holds promise for the development of advanced electronic devices with tailored confinement for enhanced functionalities.

Funder

National Research Foundation of Korea

Publisher

Wiley

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