Auger microanalysis in a conventional scanning electron microscope

Author:

Holm R.,Reinfandt B.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference26 articles.

1. Surface investigations of solids by the statical method of secondary ion mass spectroscopy (SIMS);Benninghoven;Surface Sci.,1973

2. Vorteile und Probleme bei der Auger-Mikroanalyse im REM;Brandis;BEDO,1975

3. The application of electron spectroscopy to surface studies;Brundle;J. Vac. Sci. Technol.,1974

4. Auger electron spectroscopy;Chang;Surface Sci.,1971

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1. Secondary electron hyperspectral imaging: nanostructure and chemical analysis for the LV-SEM;Materials Science and Technology;2020-03-09

2. Contamination in a scanning electron microscope and the influence of specimen cooling;Scanning;2008-04-16

3. Elemental Analysis and Imaging with X-Rays;Springer Series in Optical Sciences;1998

4. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986

5. X-ray microanalysis: a histochemical tool for elemental analysis;The Histochemical Journal;1983-06

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