Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference18 articles.
1. Alam MN Blackman M Pashley DW High-angle Kikuchi patterns Proc Roy Soc London 224 242 1954
2. Batson PE 1999
3. Booker GR Electron channeling effects using the SEM Scan Electron Microsc 489 496 1970
4. Some comments on the interpretation of the “Kickuchi-like reflection patterns” observed by scanning electron microscopy;Booker;Phil Mag,1967
5. Kikuchi-like reflection patterns observed in the scanning electron microscope;Coates;Phil Mag,1967
Cited by 34 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels;Scanning;2021-05-04
2. Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging;Microscopy and Microanalysis;2020-11-16
3. Wafer Bonding;Surface and Interface Science;2020-01-17
4. Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review;Journal of Imaging;2018-07-01
5. Bloch Waves;Electron Beam-Specimen Interactions and Simulation Methods in Microscopy;2018-04-16
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3