Dynamic secondary electron contrast effects in liquid systems studied by environmental scanning electron microscopy-Reference-Cited by-同舟云学术

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Dynamic secondary electron contrast effects in liquid systems studied by environmental scanning electron microscopy

Published:2006-12-06 Issue:6 Volume:22 Page:357-365
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Stokes D. J.,Thiel B. L.,Donald A. M.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference23 articles.

1. Charging and flashover induced by surface polarization relaxation process;Blaise;J Appl Phys,1991

2. Minimising sample evaporation in the environmental scanning electron microscope;Cameron;J Microsc,1994

3. Some considerations on the electric field induced in insulators by electron bombardment;Cazaux;J Appl Phys,1985

4. Some considerations on the secondary electron emission d, from e-irradiated insulators;Cazaux;J Appl Phys,1999

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