Direct STEM fabrication and characterization of self-supporting carbon structures for nanoelectronics
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950150406/fullpdf
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3. A new calculation of electron scattering cross sections and a theoretical discussion of image contrast in electron microscope;Burge;Pros Phys Soc,1962
4. The fabrication of amorphous SiO2 substrates suitable for transmission electron microscopy studies of ultrathin polycrystalline films;Enquist;Thin Solid Films,1986
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