Complete angular distribution of electrons backscattered from tilted multicomponent specimens-Reference-Cited by-同舟云学术

Complete angular distribution of electrons backscattered from tilted multicomponent specimens

Published:1999-05 Issue:3 Volume:21 Page:187-190
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Berger D.,Niedrig H.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950210303/fullpdf

Reference13 articles.

1. Berger D Niedrig H Wittich H Apparatus for Measurement of Complete Angular Distribution of Scattered Electrons Electron Microscopy 1996 Proc 11 th EUREM

2. The absorption and atomic number corrections in electron-probe x-ray microanalysis;Bishop;Br J Appl Phys (J Phys D),1968

3. Determination of the mean atomic number of alloys in quantitative microprobe analysis;Büchner;Arch Eisenhüttenwes,1973

4. Electron probe microanalysis;Castaing;Adv Electr Electron Phys,1960

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