Collection deficiencies of scanning electron microscopy signal contrasts measured and corrected by differential hysteresis image processing

Author:

Peters Klaus-Ruediger

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference35 articles.

1. A gaseous detector device for an environmental SEM;Danilatos;Micron Microsc Acta,1983

2. Backscattering and secondary electron emission of 10-100 keV electrons and correlation to scanning electron microscopy;Drescher;Zangew Phys,1970

3. The rationale and mode of application of thin films to non-conducting materials;Echlin;Scan Electr Microsc,1972

4. A symmetric hysteresis smoothing algorithm that preserves principal features;Ehrlich;Computer Graphics Image Proc,1978

5. Wide-band detector for micro-microampere low-energy electrical currents;Everhart;J Sci Instrum,1960

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