Author:
Jenkins K. A.,Immediato M. J.,Heidel D. F.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference10 articles.
1. Chappell TI Schuster SE Chappell BA Allan JW Klepner SP Franch RL Greier PF Restle PJ Symposium on VLSI Technology 1988
2. Electron beam testing: Methods and applications;Feuerbaum;Scanning,1983
3. A 12 ns low temperature DRAM;Henkels;IEEE Transact Electron Dev,1989
4. Noise-generation analysis and noise-suppression design techniques in megabit DRAM's;Itoh;IEEE J Solid-State Circ,1987
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