Particle-induced x-ray analysis using focused ion beams
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. Characteristic x-ray production by heavy ion bombardment as a technique for the examination of solid surfaces;Cairns;Surf Sci,1973
2. Sputtering by Particle Bombardment I
3. Production of carbon characteristic x rays by heavy-ion bombardment;Der;Phys Rev Lett,1968
4. Introduction to Focused Ion Beams
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3. 30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials;Microscopy and Microanalysis;2009-07
4. Particle-induced x-ray emission in stainless steel using 30keV Ga+ focused ion beams;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2009-07
5. Low Energy Ga Ion Beams Bombardment onside Insulating Materials and X-ray Emission;Journal of Physics: Conference Series;2007-03-01
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