The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus-Reference-Cited by-同舟云学术

The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus

Published:2006-12-07 Issue:4 Volume:23 Page:279-291
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Bertrand Isablle,Grignon Nicole,Hinsinger Philippe,Souche Gérard,Jaillard Benoǐt

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference54 articles.

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2. Dynamic of phosphorus in the rhizosphere of maize and rape grown on synthetic, phosphated calcite and goethite;Bertrand;Plant Soil,1999

3. Extension of the scatterplot approach to multiple images;Bonnet;Ultramicroscopy,1996

4. Comparison of methods to estimate occluded and resistant soil phosphorus;Bowman;Soil Sci Soc Am J,1998

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