Author:
van Bruggen M. J.,van Someren B.,Kruit P.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference9 articles.
1. Addition of different contributions to the charged particle probe size;Barth;Optik,1996
2. Born M Wolf E Principles of Optics sixth ed. Pergamon Press
3. 1980
4. Synthesis of uniform GaN quantum dot arrays via electron nanolithography of D2GaN3;Crozier;Appl Phys Lett,2004
5. High-resolution electronbeam induced deposition;Koops;J Vac Sci Tech,1988
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