Thickness‐Dependent Electronic Transport in Ultrathin, Single Crystalline Silicon Nanomembranes-Reference-Cited by-同舟云学术

Thickness‐Dependent Electronic Transport in Ultrathin, Single Crystalline Silicon Nanomembranes

Published:2019-05-12 Issue:7 Volume:5 Page:1900232
ISSN:2199-160X
Container-title:Advanced Electronic Materials
language:en
Short-container-title:Adv. Electron. Mater.

Author:

Song Enming¹²³,Guo Zhongxun⁴,Li Guodong⁵,Liao Fuyou⁴,Li Gongjin¹,Du Haina²,Schmidt Oliver G.⁵,Kim Minju⁶,Yi Yeonjin⁶,Bao Wenzhong⁴^ORCID,Mei Yongfeng¹

Affiliation:

1. Department of Materials ScienceState Key Laboratory of ASIC and SystemsFudan University Shanghai 200433 P. R. China

2. Department of Materials Science and EngineeringFrederick Seitz Materials Research LaboratoryUniversity of Illinois at Urbana‐Champaign Urbana IL 61801 USA

3. Center for Bio‐Integrated ElectronicsNorthwestern University Evanston IL 60208 USA

4. School of MicroelectronicsState Key Laboratory of ASIC and SystemFudan University Shanghai 200433 P. R. China

5. Material Systems for NanoelectronicsChemnitz University of Technology Chemnitz 09107 Germany

6. Department of PhysicsYonsei University Seoul 03722 Republic of Korea

Funder

National Natural Science Foundation of China

Science and Technology Commission of Shanghai Municipality

Publisher

Wiley

Subject

Electronic, Optical and Magnetic Materials

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