Quantum Conductance in Memristive Devices: Fundamentals, Developments, and Applications

Author:

Milano Gianluca1ORCID,Aono Masakazu2,Boarino Luca1ORCID,Celano Umberto34ORCID,Hasegawa Tsuyoshi5,Kozicki Michael6,Majumdar Sayani7ORCID,Menghini Mariela8ORCID,Miranda Enrique9ORCID,Ricciardi Carlo10ORCID,Tappertzhofen Stefan11ORCID,Terabe Kazuya2,Valov Ilia1213ORCID

Affiliation:

1. Advanced Materials Metrology and Life Sciences Division INRiM (Istituto Nazionale di Ricerca Metrologica) Strada delle Cacce 91 Torino 10135 Italy

2. International Center for Materials Nanoarchitectonics (WPI‐MANA) National Institute for Materials Science (NIMS) 1‐1 Namiki Tsukuba Ibaraki 305‐0044 Japan

3. IMEC Kapeldreef 75, Heverlee Leuven B‐3001 Belgium

4. Faculty of Science and Technology and MESA+ Institute for Nanotechnology University of Twente Enschede NB 7522 The Netherlands

5. Faculty of Science and Engineering Waseda University 3‐4‐1 Okubo, Shinjuku‐ku Tokyo 169‐8555 Japan

6. School of Electrical Computer and Energy Engineering Arizona State University Tempe AZ 85287 USA

7. VTT Technical Research Centre of Finland Ltd. VTT P.O. Box 1000 Espoo FI‐02044 Finland

8. IMDEA Nanociencia Calle Faraday 9 Madrid E28049 Spain

9. Departament d'Enginyeria Electrònica Universitat Autònoma de Barcelona (UAB) Barcelona 08193 Spain

10. Department of Applied Science and Technology Politecnico di Torino C.so Duca degli Abruzzi 24 Torino 10129 Italy

11. Chair for Micro‐ and Nanoelectronics Department of Electrical Engineering and Information Technology TU Dortmund University Emil‐Figge‐Straße 68 D‐44227 Dortmund Germany

12. JARA ‐ Fundamentals for Future Information Technology 52425 Jülich Germany

13. Peter‐Grünberg‐Institut (PGI 7) Forschungszentrum Jülich Wilhelm‐Johnen‐Straße 52425 Jülich Germany

Funder

European Metrology Programme for Innovation and Research

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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