Nanoscale Antiferromagnetic Domain Imaging using Full‐Field Resonant X‐ray Magnetic Diffraction Microscopy-Reference-Cited by-同舟云学术

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Nanoscale Antiferromagnetic Domain Imaging using Full‐Field Resonant X‐ray Magnetic Diffraction Microscopy

Published:2022-06-09 Issue:29 Volume:34 Page:2200639
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Advanced Materials

Author:

Choi Taeyang¹,Zhang Zhan²,Kim Hoon³⁴,Park Sunwook³⁴,Kim Jong‐Woo²,Lee Kyeong Jun¹,Islam Zahir²,Welp Ulrich⁵,Chang Seo Hyoung¹^ORCID,Kim B. J.³⁴

Affiliation:

1. Department of Physics Chung‐Ang University Seoul 06974 Republic of Korea

2. Advanced Photon Source Argonne National Laboratory Lemont IL 60439 USA

3. Department of Physics Pohang University of Science and Technology Pohang 37673 Republic of Korea

4. Center for Artificial Low Dimensional Electronic Systems Institute for Basic Science (IBS) 77 Cheongam‐Ro Pohang 37673 Republic of Korea

5. Materials Science Division Argonne National Laboratory Lemont IL 60439 USA

Funder

U.S. Department of Energy

Office of Science

Basic Energy Sciences

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.202200639

Reference38 articles.

1. Magnetic Domain-Wall Racetrack Memory

2. Bistability in Atomic-Scale Antiferromagnets

3. Electrical switching of an antiferromagnet

4. Current-induced spin-orbit torques in ferromagnetic and antiferromagnetic systems

5. Current-driven magnetic domain-wall logic

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anisotropy of antiferromagnetic domains in a spin-orbit Mott insulator;Physical Review B;2023-07-20

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