A Library of Atomically Thin 2D Materials Featuring the Conductive‐Point Resistive Switching Phenomenon

Author:

Ge Ruijing1ORCID,Wu Xiaohan1,Liang Liangbo2,Hus Saban M.1,Gu Yuqian1,Okogbue Emmanuel3,Chou Harry1,Shi Jianping45,Zhang Yanfeng4,Banerjee Sanjay K.1,Jung Yeonwoong36,Lee Jack C.1,Akinwande Deji1

Affiliation:

1. Microelectronics Research Center The University of Texas at Austin Austin TX 78758 USA

2. Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA

3. Nanoscience Technology Center and Department of Electrical Engineering University of Central Florida Orlando FL 32826 USA

4. Department of Materials Science and Engineering College of Engineering Peking University Beijing 100871 China

5. The Institute for Advanced Studies Wuhan University Wuhan 430072 China

6. Department of Materials Science and Technology University of Central Florida Orlando FL 32816 USA

Funder

National Science Foundation

Army Research Office

U.S. Department of Energy

Oak Ridge National Laboratory

Office of Science

Korea Institute of Energy Technology Evaluation and Planning

Ministry of Trade, Industry and Energy

University of Central Florida

National Basic Research Program of China

National Natural Science Foundation of China

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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