The use and misuse of curve fitting in the analysis of core X‐ray photoelectron spectroscopic data-Reference-Cited by-同舟云学术

The use and misuse of curve fitting in the analysis of core X‐ray photoelectron spectroscopic data

Published:2019-03-07 Issue:6 Volume:51 Page:589-610
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Sherwood Peter M.A.¹^ORCID

Affiliation:

1. Department of ChemistryUniversity of Washington Seattle WA USA

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6629

Reference44 articles.

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3. X-Ray photoelectron spectroscopy of some dimethylamino-substituted cyclotriphosphazenes

4. Practical Surface Analysis 2nd Edition 1990 J. Wiley and Sons Chichester PMA Sherwood D Briggs MP Seah Data analysis in X‐ray photoelectron spectroscopy 555 586

5. Curve fitting in surface analysis and the effect of background inclusion in the fitting process

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