Optical emission from focused ion beam milled halide perovskite device cross‐sections-Reference-Cited by-同舟云学术

Optical emission from focused ion beam milled halide perovskite device cross‐sections

Published:2022-02-03 Issue:6 Volume:85 Page:2351-2355
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microscopy Res & Technique

Author:

Kosasih Felix U.¹^ORCID,Divitini Giorgio¹²^ORCID,Orri Jordi Ferrer¹³^ORCID,Tennyson Elizabeth M.³^ORCID,Kusch Gunnar¹^ORCID,Oliver Rachel A.¹^ORCID,Stranks Samuel D.³⁴^ORCID,Ducati Caterina¹^ORCID

Affiliation:

1. Department of Materials Science and Metallurgy University of Cambridge Cambridge UK

2. Center for Convergent Technologies Istituto Italiano di Tecnologia Via Morego, 30 Genoa 16163 Italy

3. Cavendish Laboratory University of Cambridge Cambridge UK

4. Department of Chemical Engineering and Biotechnology University of Cambridge Cambridge UK

Funder

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jemt.24069

Reference34 articles.

1. Behavior of radiation-induced defects and amorphization in silicon crystal

2. Atomic scale insights into structure instability and decomposition pathway of methylammonium lead iodide perovskite

3. General Decomposition Pathway of Organic–Inorganic Hybrid Perovskites through an Intermediate Superstructure and its Suppression Mechanism

4. Cathodoluminescence of Self-Organized Heterogeneous Phases in Multidimensional Perovskite Thin Films

5. Asymmetric Cathodoluminescence Emission in CH3NH3PbI3–xBrx Perovskite Single Crystals

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Strong angular and spectral narrowing of electroluminescence in an integrated Tamm-plasmon-driven halide perovskite LED;Nature Communications;2024-07-10

2. Multimodal Characterization of Halide Perovskites: From the Macro to the Atomic Scale;Halide Perovskite Semiconductors;2023-12-22

3. Subsurface Characteristics of Metal-Halide Perovskites Polished by an Argon Ion Beam;The Journal of Physical Chemistry C;2023-04-10

4. Deep Learning-Assisted Multivariate Analysis for Nanoscale Characterization of Heterogeneous Beam-Sensitive Materials;Microscopy and Microanalysis;2023-03-30

5. Correlative microscopy and monitoring of segregation processes in optoelectronic semiconductor materials and devices;Journal of Applied Physics;2023-03-28