Author:
Austin James C.,Day Charles R.,Kearon Anthony T.,Haycock Peter W.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Requirements for commercial X-ray element-specifc imaging technology;Insight - Non-Destructive Testing and Condition Monitoring;2011-03