Affiliation:
1. USDA Agricultural Research Service Edward T. Schafer Agricultural Research Center Fargo North Dakota USA
2. Department of Plant Sciences North Dakota State University Fargo North Dakota USA
Abstract
AbstractDowny mildew (DM) and rust are two major global sunflower (Helianthin annuus L.) diseases causing significant yield losses and reducing seed quality. Host plant resistance mediated by dominant race‐specific genes has been extensively used in sunflower production to control these diseases. However, the considerable variability of the DM and rust pathogens caused by mutation or recombination has changed the dynamics of the diseases, significantly increasing their incidence in recent years. This necessitates the development and release of sunflower germplasm with enhanced levels of disease resistance. Germplasm lines HA‐DM12 (Reg. no. GP‐382, PI 700006), HA‐DM13 (Reg. no. GP‐383, PI 700007), and HA‐DM14 (Reg. no. GP‐384, PI 700008), all with multiple DM and rust resistance, were developed using phenotypic evaluation and marker‐assisted selection. The three lines share a common DM gene (PlArg) and a rust gene (R12) and a combination of different DM genes (Pl8, Pl17, and Pl18, respectively). The triple‐gene pyramids—HA‐DM12 (Pl8Pl8/PlArgPlArg/R12R12), HA‐DM13 (Pl17Pl17/PlArgPlArg/R12R12), and HA‐DM14 (Pl18Pl18/PlArgPlArg/R12R12)—confer comprehensive resistance to all races of DM and rust identified so far and can be used in sunflower breeding programs to develop hybrids with durable resistance to DM and rust.
Subject
Genetics,Agronomy and Crop Science