8.2.3 Optimal integration and test planning applied to lithographic systems1
Author:
Affiliation:
1. Systems Engineering Group, Department of Mechanical Engineering; Eindhoven University of Technology; 5600 MB Eindhoven The Netherlands
Publisher
Wiley
Subject
Automotive Engineering
Reference10 articles.
1. ASML http://www.asml.com 2006
2. Boumen , R. de Jong , I.S.M. van de Mortel-Fronczak , J.M. Rooda , J.E. Test time reduction by optimal test sequencing Proceedings of the 16th Annual International Symposium of INCOSE 2006
3. Boumen , R. de Jong , I.S.M. van de Mortel-Fronczak , J.M. Rooda , J.E. Optimal integration and test plans for software releases of lithographic systems Proceedings of the 5th Annual Conference on Systems Engineering Research (CSER) 2007
4. A model-based integration and testing method to reduce system development effort;Braspenning;Electronic Notes in Theoretical Computer Science,2006
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