An Analysis of Applicability using Quality Metrics for Ontologies on Ontology Design Patterns-Reference-Cited by-同舟云学术

An Analysis of Applicability using Quality Metrics for Ontologies on Ontology Design Patterns

Published:2015-01 Issue:1 Volume:22 Page:81-99
ISSN:1055-615X
Container-title:Intelligent Systems in Accounting, Finance and Management
language:en
Short-container-title:Intell. Sys. Acc. Fin. Mgmt.

Author:

Lantow Birger¹,Sandkuhl Kurt¹

Affiliation:

1. University of Rostock; Chair of Business Information Systems; Rostock Germany

Publisher

Wiley

Subject

Finance,General Business, Management and Accounting

Reference36 articles.

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3. Blomqvist E 2009 Semi-automatic ontology construction based on patterns

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