Optimal Stein‐type goodness‐of‐fit tests for count data-Reference-Cited by-同舟云学术

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Optimal Stein‐type goodness‐of‐fit tests for count data

Published:2022-09-27 Issue:2 Volume:65 Page:2200073
ISSN:0323-3847
Container-title:Biometrical Journal
language:en
Short-container-title:Biometrical J

Author:

Weiß Christian H.¹^ORCID,Puig Pedro²³^ORCID,Aleksandrov Boris¹

Affiliation:

1. Department of Mathematics and Statistics Helmut Schmidt University Hamburg Germany

2. Departament de Matemàtiques Universitat Autònoma de Barcelona Barcelona Spain

3. Centre de Recerca Matemàtica (CRM) Universitat Autònoma de Barcelona Barcelona Spain

Funder

Deutsche Forschungsgemeinschaft

Agencia Estatal de Investigación

Ministerio de Ciencia e Innovación

Publisher

Wiley

Subject

Statistics, Probability and Uncertainty,General Medicine,Statistics and Probability

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/bimj.202200073

Reference35 articles.

1. Goodness‐of‐fit tests for Poisson count time series based on the Stein–Chen identity

2. Aleksandrov B. Weiß C. H. Jentsch C. &Faymonville M.(2021).Novel goodness‐of‐fit tests for binomial count time series. Working Paper.

3. Nonparametric Goodness-of-Fit Tests for Discrete Null Distributions

4. A goodness of fit test for the Poisson distribution based on the empirical generating function

5. On goodness of fit tests for the Poisson, negative binomial and binomial distributions

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1. Generalized Moment Estimators Based on Stein Identities;Journal of Statistical Theory and Applications;2024-06-17

2. New characterizations of the (discrete) Lindley distribution and their applications;Mathematics and Computers in Simulation;2023-10

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