1. IC's manufacturing progress and automation
2. Trends in VLSI technologies
3. Annual Proceedings of Reliability Physics Symposium, published by the Electron Device and Reliability Societies of IEEE, Inc., New York, N. Y. 10017, U.S.A.
4. International Symposium for Testing and Failure Analysis, Proceedings of the annual conferences are available from ISTFA'76 to ISTFA'89 by ASM International, Materials Park, Ohio 4407, U.S.A.
5. International Test Conference Proceedings, IEEE Computer Society Press, 1730 Massachusetts Ave., N. W., Washington, D. C. 20036–1903, U.S.A.