AC conductivity and dielectric studies of Cd 0.8 Sn 0.2 S thin films-Reference-Cited by-同舟云学术

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AC conductivity and dielectric studies of Cd 0.8 Sn 0.2 S thin films

Published:2019-05-15 Issue: Volume: Page:e2617
ISSN:0894-3370
Container-title:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
language:en
Short-container-title:Int J Numer Model

Author:

Amroun Mohamed Nadhir¹^ORCID,Khadraoui Mohammed¹

Affiliation:

1. Laboratoire d'Elaboration et de Caractérisation des Matériaux, département d'électroniqueUniversité Djillali Liabes Sidi Bel Abbés 22000 Algeria

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modelling and Simulation

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jnm.2617

Reference54 articles.

1. Fourier transform infrared and Raman spectroscopic properties of Cd1‐xSbxS films deposited by ultrasonic spray pyrolysis;Ozer T;Eur Phys J Appl Phys,2010

2. Fabrication and evaluation of CdS/PbS thin film solar cell by chemical bath deposition technique;Saikia D;Thin Solid Films,2014

3. A study of microstructural properties and quantum size effect in SILAR deposited nano‐crystalline CdS thin films;Ashith VK;Thin Solid Films,2016

4. Screen printed CdS/CdTe cells for visible‐light‐radiation sensor;Uda H;Meas Sci Technol,1997

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