Evaluating ratio data for the determination of reduced thicknesses by XPS
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
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1. Overlayer thickness determination by XPS using the multiline approach;Surface and Interface Analysis;2008-12-19
2. Electron transport in solids. impact on applications of electron spectroscopies;Progress in Surface Science;1994-06
3. Interaction of O2 with the Fe0.84Cr0.16(001) surface studied by photoelectron spectroscopy;Surface Science;1992-10
4. XPS and SIMS Study of Anhydrous HF and UV/Ozone‐Modified Silicon (100) Surfaces;Journal of The Electrochemical Society;1989-02-01
5. Thickness measurement of thin dielectrics with electron spectroscopy;Fresenius' Zeitschrift für analytische Chemie;1989-01
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