Quantitative non-destructive in-depth composition information from XPS
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference27 articles.
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4. Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPS
5. Energy and material dependence of the inelastic mean free path of low‐energy electrons in solids
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