X-Ray photoelectron spectroscopic studies of the surface of sputter ion plated films
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. Auger and x‐ray characterization of surface nitride films on Ti, Zr, and Hf
2. in Practical Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by and appendix 3, pp 445-475 Wiley (1983).
3. X-ray photoelectron spectroscopic studies of electrode surfaces using a new controlled transfer technique
4. Smoothing of digital x-ray photoelectron spectra by an extended sliding least-squares approach
5. Data analysis techniques in x-ray photoelectron spectroscopy
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