The influence of X-ray-induced Auger electrons in quantitative electron-induced Auger spectroscopy
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference30 articles.
1. Matrix effects in quantitative auger analysis of dilute alloys
2. Recent progress in quantification of surface analysis techniques
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4. Composition and thickness of the surface segregation region of a binary alloy system determined by a quantitative Auger electron spectroscopy method
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1. Substrate effects correction in Auger electron spectrometry and electron probe microanalysis of thin films;Thin Solid Films;2005-12
2. Experimental derivation of Auger transition probabilities from X-ray excited Auger electron spectra in XPS;Fresenius' Journal of Analytical Chemistry;2000-01-14
3. Fluorescence-based photoelectron features in Auger spectra;Surface and Interface Analysis;2000
4. Characteristic and continuous fluorescence correction for electron probe microanalysis of thin coatings at oblique incidence;Journal of Analytical Atomic Spectrometry;1996
5. Auger backscattering factor at primary beam energies above 10 keV;Surface and Interface Analysis;1992-06
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