Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices-Reference-Cited by-同舟云学术

Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices

Published:2016-08-04 Issue:38 Volume:12 Page:5339-5346
ISSN:1613-6810
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Author:

Bissig Benjamin¹,Guerra-Nunez Carlos²,Carron Romain¹,Nishiwaki Shiro¹,La Mattina Fabio³,Pianezzi Fabian¹,Losio Paolo A.⁴,Avancini Enrico¹,Reinhard Patrick¹,Haass Stefan G.¹,Lingg Martina¹,Feurer Thomas¹,Utke Ivo²,Buecheler Stephan¹,Tiwari Ayodhya N.¹

Affiliation:

1. Laboratory for Thin Films and Photovoltaics; Empa-Swiss Federal Laboratories for Materials Science and Technology; Ueberlandstrasse 129 8600 Duebendorf Switzerland

2. Laboratory for Mechanics of Materials and Nanostructures; Empa-Swiss Federal Laboratories for Materials Science and Technology; Feuerwerkerstrasse 39 3602 Thun Switzerland

3. Reliability Science and Technology Laboratory; Empa-Swiss Federal Laboratories for Materials Science and Technology; Ueberlandstrasse 129 8600 Duebendorf Switzerland

4. Zurich University of Applied Sciences (ZHAW); School of Engineering; Institute of Computational Physics; Technikumstrasse 9 8401 Winterthur Switzerland

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Kompetenzzentrum für Energie und Mobilität

Bundesamt für Energie

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/smll.201601575/fullpdf

Reference45 articles.

1. Detailed Balance Limit of Efficiency of p‐n Junction Solar Cells