Ultrahigh‐Detectivity Photodetectors with Van der Waals Epitaxial CdTe Single‐Crystalline Films-Reference-Cited by-同舟云学术

Ultrahigh‐Detectivity Photodetectors with Van der Waals Epitaxial CdTe Single‐Crystalline Films

Published:2019-04 Issue:17 Volume:15 Page:1900236
ISSN:1613-6810
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language:en
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Author:

Lian Qin¹,Zhu Xuanting¹,Wang Xudong²,Bai Wei¹,Yang Jing¹,Zhang Yuanyuan¹,Qi Ruijuan¹,Huang Rong¹,Hu Weida²,Tang Xiaodong¹³,Wang Jianlu²^ORCID,Chu Junhao¹²

Affiliation:

1. Key Laboratory of Polar Materials and Devices (MOE) and Department of OptoelectronicsEast China Normal University Shanghai 200241 P. R. China

2. National Lab for Infrared PhysicsShanghai Institute of Technical PhysicsChinese Academy of Sciences Shanghai 200083 P. R. China

3. Collaborative Innovation Center of Extreme OpticsShanxi University Taiyuan Shanxi 030006 P. R. China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smll.201900236

Reference34 articles.

1. Fabrication and characterization of heterostructures with subnanometer thickness

2. Van der Waals heterostructures

3. Mixed-dimensional van der Waals heterostructures

4. Recent developments and future directions in the growth of nanostructures by van der Waals epitaxy

5. Show of adhesive strength

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