The Next Generation of Colloidal Probes: A Universal Approach for Soft and Ultra‐Small Particles-Reference-Cited by-同舟云学术

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The Next Generation of Colloidal Probes: A Universal Approach for Soft and Ultra‐Small Particles

Published:2019-09-23 Issue:43 Volume:15 Page:1902976
ISSN:1613-6810
Container-title:Small
language:en
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Author:

Mark Andreas¹,Helfricht Nicolas¹²,Rauh Astrid³,Karg Matthias³,Papastavrou Georg¹²^ORCID

Affiliation:

1. Physical Chemistry IIUniversity of Bayreuth Universitätsstr. 30 95440 Bayreuth Germany

2. Bavarian Polymer InstituteUniversity of Bayreuth Universitätsstr. 30 95440 Bayreuth Germany

3. Department of Physical Chemistry IHeinrich‐Heine‐University Universitätsstr. 1 40204 Düsseldorf Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smll.201902976

Reference72 articles.

1. Force microscopy and surface interactions

2. Force measurements with the atomic force microscope: Technique, interpretation and applications

3. Impact of atomic force microscopy on interface and colloid science

4. Investigating forces between charged particles in the presence of oppositely charged polyelectrolytes with the multi-particle colloidal probe technique

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1. Direct force measurements between sub-micron rod-shaped colloids by AFM;Colloids and Surfaces A: Physicochemical and Engineering Aspects;2024-09

2. Applications of AFM in Membrane Characterization and Fouling Analysis;ACS ES&T Engineering;2024-07-18

3. Measuring Rolling Friction at the Nanoscale;Langmuir;2024-03-18

4. Contactless calibration of microchanneled AFM cantilevers for fluidic force microscopy;VIEW;2023-11-23

5. Electrochemical grippers based on the tuning of surface forces for applications in micro- and nanorobotics;Scientific Reports;2023-05-16

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