Author:
Yang Mengfei,Hua Gengxin,Feng Yanjun,Gong Jian
Publisher
John Wiley & Sons Singapore Pte. Ltd
Cited by
15 articles.
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1. Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Availability Vs. Lifetime Trade-Space In Spacecraft Computers;2023 IEEE 9th International Conference on Space Mission Challenges for Information Technology (SMC-IT);2023-07
4. Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments;2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI);2023-06-08
5. Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip;Electronics;2023-06-06