Low angle boundary migration of shot‐peened pure nickel investigated by electron channeling contrast imaging and electron backscatter diffraction-Reference-Cited by-同舟云学术

Low angle boundary migration of shot‐peened pure nickel investigated by electron channeling contrast imaging and electron backscatter diffraction

Author:

Oh Jin‐Su¹^ORCID,Cha Hyun‐Woo¹,Kim Tae‐Hoon²,Shin Keesam³,Yang Cheol‐Woong¹^ORCID

Affiliation:

1. School of Advanced Materials Science and EngineeringSungkyunkwan University Suwon South Korea

2. Ames LaboratoryU.S. Department of Energy Ames Iowa

3. School of Nano and Advanced Materials EngineeringChangwon National University Changwon South Korea

Funder

National Research Foundation of Korea

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

Reference32 articles.

4. Dislocation density measurements in commercially pure titanium using electron channeling contrast imaging;Crimp M.;TMS Letters,2004

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