Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization-Reference-Cited by-同舟云学术

Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization

Published:2012-09-12 Issue:44 Volume:24 Page:OP309-OP313
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Wildanger Dominik,Patton Brian R.,Schill Heiko,Marseglia Luca,Hadden J. P.,Knauer Sebastian,Schönle Andreas,Rarity John G.,O'Brien Jeremy L.,Hell Stefan W.,Smith Jason M.

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adma.201203033/fullpdf

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