In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device-Reference-Cited by-同舟云学术

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In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device

Published:2015-12-21 Issue:9 Volume:28 Page:1788-1792
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Wallentin Jesper¹,Osterhoff Markus¹,Salditt Tim¹

Affiliation:

1. Institute for X-Ray Physics; University of Göttingen; Friedrich-Hund-Platz 1 37077 Göttingen Germany

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference36 articles.

1. Controlling a Nanowire Quantum Dot Band Gap Using a Straining Dielectric Envelope

2. X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires

3. Physical Insight Toward Heat Transport and an Improved Electrothermal Modeling Framework for FinFET Architectures

4. In Situ Measurement of Grain Rotation During Deformation of Polycrystals

5. In Situ X-ray Diffraction Studies of (De)lithiation Mechanism in Silicon Nanowire Anodes

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1. Fast nanoscale imaging of strain in a multi-segment heterostructured nanowire with 2D Bragg ptychography;Journal of Applied Crystallography;2024-02-01

2. Nanoscale X-ray Imaging of Composition and Ferroelastic Domains in Heterostructured Perovskite Nanowires: Implications for Optoelectronic Devices;ACS Applied Nano Materials;2023-09-21

3. Nanoscale X-ray detectors based on individual CdS, SnO2 and ZnO nanowires;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-10

4. Inducing ferroelastic domains in single-crystal CsPbBr3 perovskite nanowires using atomic force microscopy;Physical Review Materials;2021-06-01

5. High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction;Nano Research;2020-06-21

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