Probing a Device's Active Atoms-Reference-Cited by-同舟云学术

Probing a Device's Active Atoms

Published:2017-03-13 Issue:19 Volume:29 Page:1606578
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Studniarek Michał¹²,Halisdemir Ufuk¹,Schleicher Filip¹,Taudul Beata¹,Urbain Etienne¹,Boukari Samy¹,Hervé Marie³,Lambert Charles-Henri⁴,Hamadeh Abbass⁴,Petit-Watelot Sebastien⁴,Zill Olivia¹,Lacour Daniel⁴,Joly Loïc¹,Scheurer Fabrice¹,Schmerber Guy¹,Da Costa Victor¹,Dixit Anant¹,Guitard Pierre André⁵,Acosta Manuel¹,Leduc Florian²,Choueikani Fadi²,Otero Edwige²,Wulfhekel Wulf³,Montaigne François⁴,Monteblanco Elmer Nahuel⁴,Arabski Jacek¹,Ohresser Philippe²,Beaurepaire Eric¹,Weber Wolfgang¹,Alouani Mébarek¹,Hehn Michel⁴,Bowen Martin¹

Affiliation:

1. Université de Strasbourg; CNRS; Institut de Physique et Chimie des Matériaux de Strasbourg; UMR 7504 F-67000 Strasbourg France

2. Synchrotron SOLEIL; L'Orme des Merisiers; Saint-Aubin, BP 48 91192 Gif-sur-Yvette France

3. Physikalisches Institut; Karlsruhe Institute of Technology; Wolfgang-Gaede-Str. 1 76131 Karlsruhe Germany

4. Institut Jean Lamour UMR 7198 CNRS; Université de Lorraine; BP 70239 54506 Vandoeuvre les Nancy Cedex France

5. Service de Physique de l'Etat Condensé; CEA-IRAMIS-SPEC (CNRS-MPPU-URA 2464) CEA-Saclay; F-91191 Gif-sur-Yvette Cedex France

Funder

Agence Nationale de la Recherche

Labex

Institut Carnot MICA

Centre National de la Recherche Scientifique

ATOMS

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference47 articles.

1. X-ray photoemission study of CoFeB∕MgO thin film bilayers

2. X-ray studies of interface Fe-oxide in annealed MgO based magnetic tunneling junctions

3. Review of light-induced degradation in crystalline silicon solar cells

4. Bias-crafted magnetic tunnel junctions with bistable spin-dependent states

5. X-ray photoemission study of CoFeB∕MgO thin film bilayers

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