Coupling evanescent-wave fluorescence imaging and spectroscopy with scanning probe microscopy: challenges and insights from TIRF–AFM-Reference-Cited by-同舟云学术

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Coupling evanescent-wave fluorescence imaging and spectroscopy with scanning probe microscopy: challenges and insights from TIRF–AFM

Published:2006 Issue:11 Volume:38 Page:1459-1471
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Shaw James E.,Oreopoulos John,Wong Daniel,Hsu Jenny C. Y.,Yip Christopher M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference119 articles.

1. Recent advances in fluorescence correlation spectroscopy

2. [28] Diffusion in cells measured by fluorescence recovery after photobleaching

3. Challenges and Artifacts in Quantitative Photobleaching Experiments

4. From micro to nano: recent advances in high-resolution microscopy

5. Sub-Diffraction-Limited Optical Imaging with a Silver Superlens

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