Surface analysis by secondary ion emission
-
Published:2010-09-01
Issue:6
Volume:84
Page:617-646
-
ISSN:0037-9646
-
Container-title:Bulletin des Sociétés Chimiques Belges
-
language:en
-
Short-container-title:Bull. Soc. Chim. Belges
Subject
General Chemistry
Reference52 articles.
1. Kai Siegbahn and al: Atomic, molecular and solid state structure studied by means of electron spectrometry 1967
2. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Secondary Ion Emission by Anionic Surfactants;Bulletin des Sociétés Chimiques Belges;2010-09-01
2. Plenary Lecture: Ion Microscopy and Surface Analysis;Characterization of Metal and Polymer Surfaces;1977