Failure analysis of Cu(In,Ga)Se2 photovoltaic modules: degradation mechanism of Cu(In,Ga)Se2 solar cells under harsh environmental conditions

Author:

Lee Dong-Won12,Cho Won-Ju1,Song Jun-Kwang2,Kwon Oh-Yun1,Lee Won-Hee1,Park Chi-Hong3,Park Kyung-Eun3,Lee Heesoo4,Kim Yong-Nam2

Affiliation:

1. Department of Electronic Materials Engineering; Kwangwoon University; 447-1, Wolgye-dong Nowon-gu Seoul 139-701 Korea

2. Material Techonology Center; Korea Testing Laboratory; 222-13, Guro3-dong Guro-gu Seoul 152-718 Korea

3. Solar Cell Laboratory; LG Innotek Co., Ltd.; Osan 447-705 Korea

4. School of Materials Science and Engineering; Pusan National University; Busan 609-309 Korea

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. IEC 61646. Thin-Film Terrestrial Photovoltaic (PV) Modules-Design Qualification and Type Approval 2008

2. History of accelerated and qualification testing of terrestrial photovoltaic modules: a literature review;Osterwald;Progress in Photovoltaics: Research and Applications,2009

3. Osterwald CR Terrestrial photovoltaic module accelerated test-to-failure protocol 2008

4. Microdefects and point defects optically detected in Cu(In,Ga)Se2 thin film solar cells exposed to the damp and heating;Medvedkin;Solar Energy Materials and Solar Cells,2003

5. Encapsulation of Cu(InGa)Se2 solar cell with Al2O3 thin-film moisture barrier grown by atomic layer deposition;Carcia;Solar Energy Materials and Solar Cells,2010

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3