X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization-Reference-Cited by-同舟云学术

X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization

Published:2015-04-17 Issue:6 Volume:47 Page:719-722
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Palazon Francisco¹,Géhin Thomas¹,Ferrah Djawhar¹,Garnier Anaïs¹,Botella Claude¹,Grenet Geneviève¹,Souteyrand Éliane¹,Cloarec Jean-Pierre¹,Chevolot Yann¹

Affiliation:

1. Université de Lyon; Institut des Nanotechnologies de Lyon; site Ecole Centrale de Lyon, CNRS UMR 5270, 36, Avenue Guy de Collongue Ecully 69134 France

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5768/fullpdf

Reference25 articles.

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2. Quantification of PVC-PMMA polymer blend compositions by XPS in the presence of x-ray degradation effects;Artyushkova;Surf. Interface Anal.,2001

3. Degradation of polymers (PVC, PTFE, M-F) during X-ray photoelectron spectroscopy (XPS-ESCA) analysis;Coullerez;J. Surf. Anal.,1999

4. A model of radiation-induced degradation of the poly(vinylidene fluoride) surface during XPS measurements;Voinkova;Polym. Degrad. Stab.,2005

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