Ni K-edge XAFS analysis of NiO thin film with multiple scattering theory-Reference-Cited by-同舟云学术

Ni K-edge XAFS analysis of NiO thin film with multiple scattering theory

Author:

Denny Yus Rama¹²,Takahashi Kei³,Niki Kaori³,Yang Dong Seok⁴,Fujikawa Takashi³,Kang Hee Jae¹

Affiliation:

1. Department of Physics; Chungbuk National University; 52 Naesudong-ro, Heungdeok-gu Cheongju Chungbuk 361-763 South Korea

2. Department of Electrical Engineering; University of Sultan Ageng Tirtayasa; Jend. Sudirman Km. 3 Cilegon Banten 42435 Indonesia

3. Graduate School of Advanced Integration Science; Chiba University; 1-33 Yayoi-cho, Inage-ku Chiba 263-8522 Japan

4. Department of Physics Education; Chungbuk National University; 52 Naesudong-ro, Heungdeok-gu Cheongju Chungbuk 361-763 South Korea

Funder

Ministry of Education, Science and Technology

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference19 articles.

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