Application of backscattered electrons in detecting and profiling voids covered by self-supporting metallic thin film
Author:
Affiliation:
1. Department of Physics; Indian Institute of Technology Kanpur; Kanpur India
2. Design; Manufacture & Engineering Management; University of Strathclyde; Glasgow United Kingdom
Funder
department of science and technology, India
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
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5. Application of backscattered electron imaging to the study of source rocks microtextures;Belin;Org Geochem,1992
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