A new test specimen for the determination of the field of view of small‐area X‐ray photoelectron spectrometers-Reference-Cited by-同舟云学术

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A new test specimen for the determination of the field of view of small‐area X‐ray photoelectron spectrometers

Published:2020-06-26 Issue:12 Volume:52 Page:890-894
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Stockmann Jörg M.¹^ORCID,Radnik Jörg¹^ORCID,Bütefisch Sebastian²,Busch Ingo²,Weimann Thomas³,Passiu Cristiana⁴,Rossi Antonella⁴⁵,Unger Wolfgang E.S.¹^ORCID

Affiliation:

1. Surface Analysis and Interfacial Chemistry Bundesanstalt für Materialforschung und ‐prüfung Berlin Germany

2. Scanning Probe Metrology Physikalisch‐Technische Bundesanstalt Braunschweig Lower Saxony Germany

3. Nanostructuring and Clean Room Center Infrastructure Physikalisch‐Technische Bundesanstalt Braunschweig Lower Saxony Germany

4. Department of Materials ETH Zürich Zürich Switzerland

5. Department of Chemical and Geological Sciences University of Cagliari Cagliari Italy

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6831

Reference12 articles.

1. Concept of an imaging XPS system

2. Imaging XPS for industrial applications

3. Four classes of selected area XPS (SAXPS): an examination of methodology and comparison with other techniques

4. Small area x-ray photoelectron spectroscopy

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