Structural studies on Si-N gradient thin layers by grazing incidence X-ray diffraction-Reference-Cited by-同舟云学术

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Structural studies on Si-N gradient thin layers by grazing incidence X-ray diffraction

Published:2014-03-28 Issue:10-11 Volume:46 Page:1068-1070
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Karolus Malgorzata¹

Affiliation:

1. Institute of Material Science; University of Silesia - Katowice; ul. 75 Pułku Piechoty 1A 41-500 Chorzów Poland

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference10 articles.

1. RAD, a program for analysis of X-ray diffraction data from amorphous materials for personal computers

2. Structural Studies of the Relaxed Amorphous Phase in the Fe₈₁B₁₄Nb₅ Alloy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TEXTURE AND RESIDUAL STRESSES IN THE CuSn6 ALLOY SUBJECTED TO INTENSE PLASTIC DEFORMATION;Archives of Metallurgy and Materials;2023-07-26

2. Multiphase Structure of Tantalum Oxynitride TaOxNy Thin Films Deposited by Reactive Magnetron Sputtering;The Journal of Physical Chemistry C;2015-10-06

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