Absolute electroluminescence imaging with distributed circuit modeling: Excellent for solar‐cell defect diagnosis-Reference-Cited by-同舟云学术

Absolute electroluminescence imaging with distributed circuit modeling: Excellent for solar‐cell defect diagnosis

Published:2019-12-26 Issue:4 Volume:28 Page:295-306
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog Photovolt Res Appl

Author:

Hong Jianyu¹^ORCID,Wang Youyang¹,Chen Yuanjing¹,Hu Xiaobo¹,Weng Guoen¹,Chen Shaoqiang¹²^ORCID,Akiyama Hidefumi³,Zhang Yingbin⁴,Zhang Bo⁵,Chu Junhao¹²

Affiliation:

1. Department of Electronic EngineeringEast China Normal University Shanghai China

2. Shanghai Institute of Intelligent Electronics and SystemsFudan University Shanghai China

3. Institute for Solid State PhysicsThe University of Tokyo Kashiwa Japan

4. State Key Laboratory of PV Science and TechnologyTrinasolar Energy Co. Ltd Changzhou China

5. National Institute of Clean‐and‐Low‐Carbon Energy Beijing China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pip.3236

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5. Impact of Se flux on the defect formation in polycrystalline Cu(In,Ga)Se2 thin films grown by three stage evaporation process

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