High‐resolution peak analysis in TOF SIMS data-Reference-Cited by-同舟云学术

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High‐resolution peak analysis in TOF SIMS data

Published:2020-10-15 Issue:1 Volume:53 Page:53-67
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Gelb Lev D.¹^ORCID,Shahrokh Esfahani Negar²,Walker Amy V.¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering University of Texas at Dallas Richardson TX USA

2. Department of Chemistry and Biochemistry University of Texas at Dallas Richardson TX USA

Funder

Division of Chemistry

National Science Foundation

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6872

Reference32 articles.

1. Extending the dynamic range of proton transfer reaction time-of-flight mass spectrometers by a novel dead time correction

2. Dead time correction of photon correlation functions;Schätzel K;Appl Phys B,1986

3. Statistical parameter study of the time interval distribution for nonparalyzable, paralyzable, and hybrid dead time models;Syam NS;J Korean Phys Soc,2018

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Identification of Ubiquitously Present Polymeric Adlayers on 2D Transition Metal Dichalcogenides;ACS Nano;2023-05-23

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