Spectroscopy vs. Electrochemistry: Catalyst Layer Thickness Effects on Operando/In Situ Measurements

Abstract

AbstractIn recent years, operando/in situ X‐ray absorption spectroscopy (XAS) has become an important tool in the electrocatalysis community. However, the high catalyst loadings often required to acquire XA‐spectra with a satisfactory signal‐to‐noise ratio frequently imply the use of thick catalyst layers (CLs) with large ion‐ and mass‐transport limitations. To shed light on the impact of this variable on the spectro‐electrochemical results, in this study we investigate Pd‐hydride formation in carbon‐supported Pd‐nanoparticles (Pd/C) and an unsupported Pd‐aerogel with similar Pd surface areas but drastically different morphologies and electrode packing densities. Our in situ XAS and rotating disk electrode (RDE) measurements with different loadings unveil that the CL‐thickness largely determines the hydride formation trends inferred from spectro‐electrochemical experiments, therewith calling for the minimization of the CL‐thickness in such experiments and the use of complementary thin‐film control measurements.