The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics
Author:
Publisher
Wiley
Subject
Medical Laboratory Technology,Instrumentation,Histology,Anatomy
Reference42 articles.
1. Charging and flashover induced by surface polarization relaxation process
2. editor. 2001. Scanning probe microscopy and spectroscopy: Theory, techniques and applications. New York: Wiley.
3. Some considerations on the electric field induced in insulators by electron bombardment
4. 1993. Some physical descriptions of the charging effects in insulators under irradiation. In: editor. Ionization of solids by heavy particles. New York: Plenum, pp. 325–350.
5. Electron Probe Microanalysis of Insulating Materials: Quantification Problems and Some Possible Solutions
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