Noise filtering and deconvolution of XPS data by wavelets and Fourier transform-Reference-Cited by-同舟云学术

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Noise filtering and deconvolution of XPS data by wavelets and Fourier transform

Published:2004-01 Issue:1 Volume:36 Page:71-80
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Charles Catherine,Leclerc Gervais,Louette Pierre,Rasson Jean-Paul,Pireaux Jean-Jacques

Funder

Belgian FNRS.

Belgian Prime Minister's Office

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.1650/fullpdf

Reference11 articles.

1. Report on the 22nd IUVSTA Workshop ?x-ray photoelectron spectroscopy: from physics to data?

2. The use of least squares for XPS peak parameters estimation. Part 1. Myths and realities

3. Ideal spatial adaptation by wavelet shrinkage

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3. An Open Source, Iterative Dual-Tree Wavelet Background Subtraction Method Extended from Automated Diffraction Pattern Analysis to Optical Spectroscopy;Applied Spectroscopy;2019-09-13

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5. The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) functions in the context of peak fitting X-ray photoelectron spectroscopy (XPS) narrow scans;Applied Surface Science;2018-07

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