1. and , DYNAMO: A Program for the Simulation of Transient Faults in Digital Circuits, IEEE 1991 Custom Integrated Circuits Conference, paper 4.3.
2. Boundary Scan and its Application to Analog-Digital ASIC Testing in a Board/System Environment. IEEE 1989 Custom Integrated Circuits Conference, paper 22.4.
3. , and , Mixed Mode Incremental Simulation and Concurrent Fault Simulation, 1990 IEEE Int. Conf. on Computer-Aided Design, Nov. 11-15, Santa Clara CA, pp. 158–161.
4. Fundamentals of testability-a tutorial
5. Mixed-Mode Simulation for Time-Domain Fault Analysis, 1989 International Test Conference, paper 9.3, pp. 231–241.